Year |
Citation |
Score |
2007 |
Rolandi M, Suez I, Scholl A, Fréchet JM. Fluorocarbon resist for high-speed scanning probe lithography. Angewandte Chemie (International Ed. in English). 46: 7477-80. PMID 17702084 DOI: 10.1002/Anie.200701496 |
0.709 |
|
2007 |
Backer SA, Suez I, Fresco ZM, Rolandi M, Fréchet JM. Covalent formation of nanoscale fullerene and dendrimer patterns. Langmuir : the Acs Journal of Surfaces and Colloids. 23: 2297-9. PMID 17269811 DOI: 10.1021/La0631973 |
0.694 |
|
2007 |
Backer SA, Suez I, Fresco ZM, Fŕchet JMJ, Conway JA, Vedantam S, Lee H, Yablonovitch E. Evaluation of new materials for plasmonic imaging lithography at 476 nm using near field scanning optical microscopy Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 25: 1336-1339. DOI: 10.1116/1.2757184 |
0.722 |
|
2007 |
Suez I, Rolandi M, Backer SA, Scholl A, Doran A, Okawa D, Zettl A, Fréchet JMJ. High-field scanning probe lithography in hexadecane: Transitioning from field induced oxidation to solvent decomposition through surface modification Advanced Materials. 19: 3570-3573. DOI: 10.1002/Adma.200700716 |
0.701 |
|
2005 |
Suez I, Backer SA, Fréchet JM. Generating an etch resistant "resist" layer from common solvents using scanning probe lithography in a fluid cell. Nano Letters. 5: 321-4. PMID 15794619 DOI: 10.1021/Nl048014G |
0.743 |
|
2004 |
Fresco ZM, Suez I, Backer SA, Fréchet JM. AFM-induced amine deprotection: triggering localized bond cleavage by application of tip/substrate voltage bias for the surface self-assembly of nanosized dendritic objects. Journal of the American Chemical Society. 126: 8374-5. PMID 15237983 DOI: 10.1021/Ja047774Q |
0.676 |
|
2004 |
Rolandi M, Suez I, Dai H, Fréchet JMJ. Dendrimer monolayers as negative and positive tone resists for scanning probe lithography Nano Letters. 4: 889-893. DOI: 10.1021/Nl049700I |
0.655 |
|
2003 |
Fresco ZM, Bensel N, Suez I, Backer SA, Fréchet JMJ, Conley W. Fluorinated chemically amplified dissolution inhibitors for 157 nm nanolithography Journal of Photopolymer Science and Technology. 16: 27-35. DOI: 10.2494/Photopolymer.16.27 |
0.705 |
|
2003 |
Fresco ZM, Bensel N, Suez I, Backer SA, Fréchet JM, Conley W. Fluorinated Chemically Amplified Dissolution Inhibitors for 157 nm Nanolithography Journal of Photopolymer Science and Technology. 16: 27-35. DOI: 10.2494/photopolymer.16.27 |
0.71 |
|
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